Open Access Journal

ISSN : 2394-2320 (Online)

International Journal of Engineering Research in Computer Science and Engineering (IJERCSE)

Monthly Journal for Computer Science and Engineering

Open Access Journal

International Journal of Engineering Research in Computer Science and Engineering (IJERCSE)

Monthly Journal for Computer Science and Engineering

ISSN : 2394-2320 (Online)

REDUCING LEAKAGE POWER IN CMOS CIRCUITS

Author : Arul V 1

Date of Publication :21st August 2017

Abstract: Later Technological advances in Wireless Communication has demonstrated the union of terminals and, arranges that help interactive media for continuous applications. This clearly puts a massive weight on battery of any cell phone. The CMOS has been the main innovation in this age of portable correspondence because of its low force utilization. Decrease of leakage power in CMOS has been the examination enthusiasm for the most recent few years. In CMOS coordinated circuit structure there is a significant exchange off between innovation scaling and static force utilization. In the present CMOS innovation the leakage power utilization assumes a noteworthy work. While getting closer to Nano-scale plan the complete chip power utilization becomes reliant on leakage power. Expanding the battery life in versatile remote correspondence and portable registering also, comparable different applications is the subject of research now-a day’s... Further, since the leakage of battery exists even at the point when gadgets are out of gear state makes leakage power misfortune generally basic in CMOS VLSI circuits. Numerous systems have been advanced to handle the issue which is still in progress. This paper centres on the audit of different works done in this field till the present date.

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